Yang Chen on Twitter: "Glad to have this joint work with @aaronyiding and Prof. Atte Oksanen! The two co-first authors are still in their 3rd year of undergraduate study. Keep going!" /
Optimized Overlay Metrology Marks: Theory and ... - IEEE Xplore
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1] A. Avizienis, J.-C. Laprie, B. Randell, and C. Landwehr. Basic concepts and taxonomy of dependable and secure computing. IEE
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Optimized Si-Based Blocked Impurity Band Detector Under Alternative Operational Mode
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